Tag: Kelvin Probe Force Microscopy (KPFM)

Introduction to KPFM Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a powerful scanning probe microscopy technique used to measure the contact potential difference (CPD), or electrostatic surface potential, between the tip of a probe and the sample surface. The technique is based on the original work of Lord Kelvin, who…